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Michelson Interferometer

Introduction

A basic shape interferometer used for observing surface accuracy of reflection samples.
It is characterized by two optical paths deflected orthogonally by the reflector.
The difference between the surface shapes of the reflectors installed in each optical path can be observed as distortion of fringes.

Producer:Japan
Description
Description
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IFS2-MI-25
激光组件 空间滤波器组件 准直镜组件 反射镜组件 半透半反镜组件 屏幕组件
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Michelson Interferometer /IFS2-MI-25
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