A compact stand-alone type beam measuring device with an integrated touch screen.
◦Supports a wide wavelength measurement range (190nm to 2700nm), and capable of measuring beam profile, beam size, beam shape, position and beam intensity. It measures beam size between 3μm and 9mm with 0.1μm resolution.
[Features]
◦12-bit A/D converter enables high resolution sampling.
◦Real-time beam profiling displays beam size, beam intensity and Gaussian fits.
◦Capable of calculating the beam gravity center and ellipticity of loaded data. In addition, it can save external control and logging data in Excel or text (.txt) format using RS232C and TCP/IP communication.
◦USB control type is available as option.
| Model | Specifications | VS | Unit Price | Date | Cart | ||||||||
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OS-BA3-IR3E-SAT |
刀口数×3 IR-E传感器φ3mm |
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OS-BA3-IR3-SAT |
刀口数×3 IR传感器φ3mm |
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OS-BA3-IR5-SAT |
刀口数×3 IR传感器φ5mm |
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OS-BA3-Si-SAT |
刀口数×3 Si传感器φ5mm |
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OS-BA3-UV-SAT |
刀口数×3 UV-Si传感器φ5mm |
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OS-BA7-IR3E-SAT |
刀口数×7 IR-E传感器φ3mm |
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OS-BA7-IR3-SAT |
刀口数×7 IR传感器φ3mm |
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OS-BA7-IR5-SAT |
刀口数×7 IR传感器φ5mm |
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OS-BA7-Si-SAT |
刀口数×7 Si传感器□9mm |
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OS-BA7-UV-SAT |
刀口数×7 UV-Si传感器□9mm |
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Multiple Scanning Knife-Edge Beam Profiler(Discontinued) /OS-BA7-UV-SAT
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